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3M™ Trizact™ CMP Pads use microreplication technology to help provide precise asperity control for low defectivity and consistent pad performance throughout pad life. This proprietary approach to microreplication helps to deliver a longer pad life and eliminates the need for a diamond pad conditioner, enabling you to have lower cost of ownership and less downtime.
An innovative CMP material, 3M™ Trizact™ CMP Pads are for advanced node semiconductor manufacturing. Their precisely engineered three-dimensional microreplicated asperities and pores helps to ensure uniform asperity diameter, height and pore depth. The controlled microreplicated features helps ensure consistent performance pad-to-pad to meet the demands of semiconductor fabrication. The innovative groove design on these CMP pads help provide efficient and uniform slurry flow distribution.
Application | CMP, Advanced Node (Memory & Logic), Wafer Manufacturing, Semiconductor Fabrication |
Product Usage | Semiconductor Wafers |
Overall Diameter (Imperial) | 20 in, 29.1 in, 29.5 in, 30.5 in |
Overall Diameter (Metric) | 508 mm, 739.1 mm, 749.3 mm, 774.7 mm |
Article Information Sheet
Document Number: MSDS_3996162_US_EN_AIS
(PDF)
Article Information Sheet
Document Number: MSDS_4063210_US_EN_AIS
(PDF)
Article Information Sheet
Document Number: MSDS_3900313_US_EN_AIS
(PDF)
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